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Cherry Bhargava

Failure Prediction of Temperature Sensor Using Hybrid Neural Fuzzy

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The growth of Electronic products becomes more complex due to a major requirement of high reliability, high speed and low cost. In today's world, reliability becomes a great need of any electronic equipment for active as well as passive components such as a temperature sensor. Failure prediction is the major constraints to predict the remaining useful life of the component in order to anticipate the costly failures or system unavailability. In the modern competitive market, low cost and high performance are the key factors to attract the customers towards their products. Growing system complexity demands robust control to reduce system contro… Mehr

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Produktdetails


Weitere Autoren: Sharma, Pardeep / Ali, Sahib
  • ISBN: 978-613-9-84718-1
  • EAN: 9786139847181
  • Produktnummer: 37284487
  • Verlag: LAP Lambert Academic Publishing
  • Sprache: Englisch
  • Erscheinungsjahr: 2018
  • Seitenangabe: 92 S.
  • Masse: H22.0 cm x B15.0 cm x D0.6 cm 155 g
  • Abbildungen: Paperback
  • Gewicht: 155

Über den Autor


Cherry Bhargava is working as an Assistant Professor and Head, VLSI Domain, Lovely Professional University, India. She is an alumnus of Thapar University, Patiala. She has submitted Ph.D. at IKGPTU. Pardeep Kumar Sharma is working as Assistant Professor and pursuing Ph.D. from LPU. Sahib Ali is a research scholar at LPU.

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