Efficient Test Methodologies for High-Speed Serial Links
With the increasing demand for higher data bandwidth, communication systems' data rates have reached the multi-gigahertz range and even beyond. Advances in semiconductor technologies have accelerated the adoption of high-speed serial interfaces, such as PCI-Express, Serial-ATA, and XAUI, in order to mitigate the high pin-count and the data-channel skewing problems. However, with the increasing number of I/O pins and greater data rates, significant challenges arise for testing high-speed interfaces in terms of test cost and quality, especially in high volume manufacturing (HVM) environments. Efficient Test Methodologies for High-Speed Serial L…
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Produktdetails
Weitere Autoren: Cheng, Kwang-Ting (Tim)
- ISBN: 978-90-481-3442-7
- EAN: 9789048134427
- Produktnummer: 5099799
- Verlag: Springer-Verlag GmbH
- Sprache: Englisch
- Erscheinungsjahr: 2009
- Seitenangabe: 98 S.
- Masse: H24.4 cm x B16.4 cm x D1.8 cm 317 g
- Reihenbandnummer: 51
- Gewicht: 317
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