Defects in Advanced Electronic Materials and Novel Low Dimensional Structures
Defects in Advanced Electronic Materials and Novel Low Dimensional Structures provides a comprehensive review on the recent progress in solving defect issues and deliberate defect engineering in novel material systems. It begins with an overview of point defects in ZnO and group-III nitrides, including irradiation-induced defects, and then look at defects in one and two-dimensional materials, including carbon nanotubes and graphene. Next, it examines the ways that defects can expand the potential applications of semiconductors, such as energy upconversion and quantum processing. The book concludes with a look at the latest advances in theory.…
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Produktdetails
Weitere Autoren: Buyanova, Irina (Hrsg.) / Chen, Weimin (Hrsg.)
- ISBN: 978-0-08-102054-8
- EAN: 9780081020548
- Produktnummer: 35967317
- Verlag: Elsevier Science & Techn.
- Sprache: Englisch
- Erscheinungsjahr: 2018
- Seitenangabe: 306 S.
- Plattform: EPUB
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